我就是我,晶晶亮!
级别: 荣誉元老
UID: 36213
精华: 0
发帖: 3996
威望: 146 点
积分转换
愚愚币: 11663 YYB
在线充值
贡献值: 0 点
在线时间: 2533(小时)
注册时间: 2007-10-22
最后登录: 2018-05-16
楼主  发表于: 2010-12-31 12:48

 Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures

Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures
by: Milos Stanisavljevic, Alexandre Schmid, Yusuf Leblebici
•Publisher:   Springer
•Number Of Pages:   195
•Publication Date:   2010-10-21
•IN-10 / ASIN:   1441962166
•IN-13 / EAN:   9781441962164


Product Description:
This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.
本部分内容设定了隐藏,需要回复后才能看到

分享:

愚愚学园属于纯学术、非经营性专业网站,无任何商业性质,大家出于学习和科研目的进行交流讨论。

如有涉侵犯著作权人的版权等信息,请及时来信告知,我们将立刻从网站上删除,并向所有持版权者致最深歉意,谢谢。